| Iterative Frequency Tuning for Burst Excitation in FT-ICR Mass Spectrometry |
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*a) Department of Applied Physics and Chemistry, The University of Electro-Communications (1-5-1 Chofugaoka, Chofu-shi, Tokyo 182, Japan) b) Present address: Stanley Electric Co., Ltd. (2-9-13 Nakameguro, Meguro-ku, Tokyo 153, Japan) |
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| This paper proposes an iterative method of frequency tuning for the burst (fixed frequency rectangular pulse) excitation in FT-ICR spectrometry. Computer simulation of FT-ICR experiment using this excitation method was performed to examine the experimental conditions which converge the excitation frequencies in iteration. Experiment utilizing an FT-ICR spectrometer was carried out to determine the isotope abundance ratio of xenon ions. These results have demonstrated that the method improves appreciably the quantitative performance of FT-ICR spectrometers. | ||
| Key words: Ion cyclotron resonance spectrometry (ICR), Fourier transform mass spectrometry (FT-MS), Fourier transform ion cyclotron resonance spectrometry (FT-ICR) | ||
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