JMSSJ On-line

JMSSJ On-line, Vol. 46 (1998) No. 5, pp. 433-436

Observation of Doubly Charged Tellurium Cluster Ions at Small Size Range Using a Secondary Ion Mass Spectrometry		>> Full Text PDF >> References
*Takaya SATOH^a), Hiroyuki ITO^b), Toshio ICHIHARA^c), Itsuo KATAKUSE^a), and Takekiyo MATSUO^b)** ^a) Department of Earth and Space Science, Graduate School of Science, Osaka University (1-1 Machikaneyama-cho, Toyonaka 560-0043, Japan)* ^b) Department of Physics, Graduate School of Science, Osaka University (1-16 Machikaneyama-cho, Toyonaka 560-0043, Japan) ^c) Department of Physics, Faculty of Science, Osaka University (1-1 Machikaneyama-cho, Toyonaka 560-0043, Japan)

Mass spectra of doubly charged tellurium clusters were investigated by a secondary ion mass spectrometry. Cluster ions were produced by the Xe ions bombardment on the tellurium sheet and were mass-analyzed using a grand-scale sector type mass spectrometer. Te₂²⁺, Te₃²⁺, and Te₅²⁺ were observed.

Key words: Tellurium cluster ion, Doubly charged cluster ion, Initial kinetic energy, Secondary ion mass spectrometry (SIMS), Double focusing sector type mass spectrometer