JMSSJ On-line

JMSSJ On-line, Vol. 50 (2002) No. 5, pp. 213-216

Development of a TOF Mass Spectrometer Using a Sector Magnet and Detection of Cluster Dissociations		>> Full Text PDF >> References
*Satoshi TOMIE^a), Yoshihiro MANABE^b), Hiroki SAKAE^b), Takaya SATOH^b), Michisato TOYODA^b), Toshio ICHIHARA^b) ,and Itsuo KATAKUSE^b)** ^a)Development and Design of LSI for Communications Systems (3-9 Shinyokohama 2-chome,Kohoku-ku,Yokohama,Kanagawa 222-0033, Japan ) ^*b)Department of Physics,Graduate School of Science,Osaka University (1-16 Machikaneyama,Toyonaka,Osaka 560-0043,Japan )

In the studies on dissociation patterns of clusters using a single focusing mass spectrometer, product ions decomposed between a main slit and an entrance of a magnet appear in mass spectra at mass M_ap= M_pro²/M_pre, whereM_pro denotes the mass of product ions and M_pre; mass of precursor ions. In the case of decomposition from cluster size nto n-m(n>m), the product ions appear at size of (n-m)²/n. When n is much larger than m, (n-m)²/n is very close to (n-2m), and it is difficult to resolve the dissociated n and undissociat ed (n-2m) cluster ions. In order to study on decomposition patterns of clusters, we attached the TOF function to the sector type mass spectrometer and detected product ions. We attached the chopper in front of the main slit to get the pulsed beam and use silver clusters as the sample.

Key words: Ag clusters,Dissociation of clusters,TOF mass spectrometer,Single focusing mass spectrometer