| Electrospray Droplet Impact Secondary-Ion Mass Spectrometry |
>> Full Text PDF
>> References |
|
University of Yamanashi, Clean Energy Research Center, Kofu, YAMANASHI, JAPAN |
||
| A new ionization method, electrospray droplet impact ionization (EDI), has been developed for matrix-free secondary-ion mass spectrometry (SIMS). The charged droplets formed by electrospraying 1 M acetic acid aqueous solution are sampled through an orifice with a diameter of 400 μm into the first vacuum chamber, transported into a quadrupole ion guide, and accelerated at 10 kV after exiting the ion guide. The droplets impact on a dry solid sample (no matrix used) deposited on a stainless steel substrate. The secondary ions formed by the impact are transported to a second quadrupole ion guide and are mass-analyzed by an orthogonal time-of-flight mass spectrometer. EDI/SIMS was found to be an easy to operate and versatile method for molecular-level surface analysis. | ||
| Key words: Electrospray droplet impact, Surface analysis, Static limit, Matrix-free | ||
| [ Full Text PDF ] [ References ] |
| © COPYRIGHT by The Mass Spectrometry Society of Japan. All Rights Reserved. |